A Blockchain-Integrated Decentralized Examination Framework with Deep Learning–Driven Question Generation and Intelligent Proctoring

Authors

  • Meesala Bala Rama Krishna Author
  • D. D. D. Suri Babu Author
  • D.Phani Kumar Author

DOI:

https://doi.org/10.62643/

Keywords:

Blockchain-based Examination System, Smart Contracts, IPFS Storage, Deep Learning Question Generation, Biometric Authentication, Intelligent Proctoring, Decentralized Ledger Technology

Abstract

The rising rate of question papers leakages, unauthorized access and malpractices in examinations have highlighted serious weaknesses in the conventional centralized examination techniques. To overcome these difficulties, this paper will offer a Blockchain-Embedded Decentralized Examination Framework that guarantees safe question paper management, computerized execution of exams, and smart monitoring. The suggested framework utilizes Ethereum-based smart contracts to implement time limited access control and have immutable audit trails, and encrypted question papers are stored efficiently in the Interplanetary File System (IPFS) to enhance decentralized storage. Adaptive question paper generation, biometric-based user authentication and real-time proctoring of examinations through behavioral analysis are based on deep learning models. Combining blockchain with intelligent automation will remove single points of failure, improve transparency, avoid illegal manipulation. It has been experimentally confirmed that the framework offers safe question dispensation, precise identity check, and consistent result regulation with a minimum human intervention. The solution proposal provides scalable, tamper safe, and future conceptualized digital examination infrastructure apt to educational institutions, certifying authorities, and large-scale authorities in assessments.

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Published

25-02-2026

How to Cite

A Blockchain-Integrated Decentralized Examination Framework with Deep Learning–Driven Question Generation and Intelligent Proctoring. (2026). International Journal of Engineering Research and Science & Technology, 22(1), 527-532. https://doi.org/10.62643/