An End-to-End Deep Residual Learning Paradigm for Robust Visual Defect Detection and Quality Assessment in Baked Product Processing Systems. International Journal of Engineering Research and Science & Technology, [S. l.], v. 22, n. 2(1), p. 1793–1804, 2026. DOI: 10.62643/ijerst.2026.v22.n2(1).2928. Disponível em: https://ijerst.org/index.php/ijerst/article/view/2928. Acesso em: 17 aug. 2026.