Early Detection of Autism Spectrum Disorder in Toddlers: A Fast and Efficient Machine Learning Approach. International Journal of Engineering Research and Science & Technology, [S. l.], v. 22, n. 2, p. 644–650, 2026. DOI: 10.62643/. Disponível em: https://ijerst.org/index.php/ijerst/article/view/2362. Acesso em: 8 sep. 2026.